Simulation-Based Bug Trace Minimization With BMC-Based Refinement
In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 26 (2007), Heft 1, S. 152-165
Online
academicJournal
Zugriff:
Titel: |
Simulation-Based Bug Trace Minimization With BMC-Based Refinement
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Autor/in / Beteiligte Person: | Chang, K. H. ; Bertacco, V. ; Markov, I. L. |
Link: | |
Zeitschrift: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 26 (2007), Heft 1, S. 152-165 |
Veröffentlichung: | 2007 |
Medientyp: | academicJournal |
ISSN: | 0278-0070 (print) ; 1937-4151 (print) |
DOI: | 10.1109/TCAD.2006.882511 |
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