Measurement of the FSR of a high finesse etalon with 2.5 kHz accuracy using a narrow-linewidth frequency swept laser
In: Conference on Lasers and Electro-Optics (CLEO); (2010-05-01) S. 1-2
Konferenz
Zugriff:
Titel: |
Measurement of the FSR of a high finesse etalon with 2.5 kHz accuracy using a narrow-linewidth frequency swept laser
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Autor/in / Beteiligte Person: | Mandridis, D. ; Bagnell, M. ; Ozdur, I. ; Delfyett, P.J. |
Quelle: | Conference on Lasers and Electro-Optics (CLEO); (2010-05-01) S. 1-2 |
Veröffentlichung: | 2010 |
Medientyp: | Konferenz |
ISBN: | 978-1-55752-890-2 (print) |
DOI: | 10.1364/CLEO.2010.JWA42 |
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