Long-Term Behaviour of Plug-in Connectors with Copper Beryllium Contact Lamellas Depending on Stress Relaxation
In: IEEE Holm Conference on Electrical Contacts (Holm 2010); (2010-10-01) S. 1-6
Konferenz
Zugriff:
Titel: |
Long-Term Behaviour of Plug-in Connectors with Copper Beryllium Contact Lamellas Depending on Stress Relaxation
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Autor/in / Beteiligte Person: | Lucke, Nils ; Grossmann, Steffen ; Lobl, Helmut ; Ledermann, Tom ; Freudiger, George |
Quelle: | IEEE Holm Conference on Electrical Contacts (Holm 2010); (2010-10-01) S. 1-6 |
Veröffentlichung: | 2010 |
Medientyp: | Konferenz |
ISBN: | 978-1-4244-8177-4 (print) ; 978-1-4244-8174-3 (print) ; 978-1-4244-8176-7 (print) |
ISSN: | 1062-6808 (print) ; 2158-9992 (print) |
DOI: | 10.1109/HOLM.2010.5619471 |
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