Orphan Defects: Chance Finding?
In: Artificial Intelligence with Applications in Engineering and Technology (ICAIET); (2014-12-01) S. 74-79
Konferenz
Zugriff:
Titel: |
Orphan Defects: Chance Finding?
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Autor/in / Beteiligte Person: | Prasad, Dhanyamraju S U M ; Kanakadandi, Satya Sai Prakash |
Quelle: | Artificial Intelligence with Applications in Engineering and Technology (ICAIET); (2014-12-01) S. 74-79 |
Veröffentlichung: | 2014 |
Medientyp: | Konferenz |
ISBN: | 978-1-4799-7909-7 (print) ; 978-1-4799-7910-3 (print) |
DOI: | 10.1109/ICAIET.2014.22 |
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