Symptomatic Bug Localization for Functional Debug of Hardware Designs
In: 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID); (2016) S. 517-522
Konferenz
Zugriff:
Titel: |
Symptomatic Bug Localization for Functional Debug of Hardware Designs
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Autor/in / Beteiligte Person: | Pal, Debjit ; Vasudevan, Shobha |
Quelle: | 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID); (2016) S. 517-522 |
Veröffentlichung: | 2016 |
Medientyp: | Konferenz |
ISBN: | 978-1-4673-8700-2 (print) |
ISSN: | 2380-6923 (print) |
DOI: | 10.1109/VLSID.2016.14 |
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