Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life
In: International Conference on IC Design and Technology (ICICDT); (2016-06-01) S. 1-3
Konferenz
Zugriff:
Titel: |
Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life
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Autor/in / Beteiligte Person: | Ren, Pengpeng ; Wang, Runsheng ; Huang, Ru |
Quelle: | International Conference on IC Design and Technology (ICICDT); (2016-06-01) S. 1-3 |
Veröffentlichung: | 2016 |
Medientyp: | Konferenz |
ISBN: | 978-1-5090-0827-8 (print) |
DOI: | 10.1109/ICICDT.2016.7542063 |
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