AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool
In: IEEE Transactions on Applied Superconductivity, Jg. 27 (2017-06-01), Heft 4, S. 1-1
Online
academicJournal
Zugriff:
Titel: |
AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool
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Autor/in / Beteiligte Person: | Semenov, V.K. ; Polyakov, Y.A. ; Tolpygo, S.K. |
Link: | |
Zeitschrift: | IEEE Transactions on Applied Superconductivity, Jg. 27 (2017-06-01), Heft 4, S. 1-1 |
Veröffentlichung: | 2017 |
Medientyp: | academicJournal |
ISSN: | 1051-8223 (print) ; 1558-2515 (print) ; 2378-7074 (print) |
DOI: | 10.1109/TASC.2017.2669585 |
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