JGRE: An Analysis of JNI Global Reference Exhaustion Vulnerabilities in Android
In: 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN); (2017-06-01) S. 427-438
Konferenz
Zugriff:
Titel: |
JGRE: An Analysis of JNI Global Reference Exhaustion Vulnerabilities in Android
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Autor/in / Beteiligte Person: | Gu, Yacong ; Sun, Kun ; Su, Purui ; Li, Qi ; Lu, Yemian ; Ying, Lingyun ; Feng, Dengguo |
Quelle: | 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN); (2017-06-01) S. 427-438 |
Veröffentlichung: | 2017 |
Medientyp: | Konferenz |
ISBN: | 978-1-5386-0542-4 (print) ; 978-1-5386-0541-7 (print) |
ISSN: | 2158-3927 (print) |
DOI: | 10.1109/DSN.2017.40 |
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