A Study of LDE on Stdcell Device Performance in Advance FinFET Technology
In: 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT); (2018-10-01) S. 1-3
Konferenz
Zugriff:
Titel: |
A Study of LDE on Stdcell Device Performance in Advance FinFET Technology
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Autor/in / Beteiligte Person: | Gu, Yu-Zhu ; Lu, Hai-Sheng ; Zhang, Xiang-Qiang ; Lin, Meng ; Zou, Xiao-wei ; Wong, Waisum |
Quelle: | 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT); (2018-10-01) S. 1-3 |
Veröffentlichung: | 2018 |
Medientyp: | Konferenz |
ISBN: | 978-1-5386-4440-9 (print) ; 978-1-5386-4439-3 (print) ; 978-1-5386-4441-6 (print) |
DOI: | 10.1109/ICSICT.2018.8565667 |
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