Impact of trapped interface charges on short channel characteristics of WFE high-K SOI MOSFET
In: Devices for Integrated Circuit (DevIC); (2019-03-01) S. 118-123
Konferenz
Zugriff:
Titel: |
Impact of trapped interface charges on short channel characteristics of WFE high-K SOI MOSFET
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Autor/in / Beteiligte Person: | Saha, Priyanka ; Banerjee, Pritha ; Dash, Dinesh Kumar ; Sarkar, Subir Kumar |
Quelle: | Devices for Integrated Circuit (DevIC); (2019-03-01) S. 118-123 |
Veröffentlichung: | 2019 |
Medientyp: | Konferenz |
ISBN: | 978-1-5386-6722-4 (print) |
DOI: | 10.1109/DEVIC.2019.8783522 |
Sonstiges: |
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