A Prognostic Model Based on DBN and Diffusion Process for Degrading Bearing
In: IEEE Transactions on Industrial Electronics, Jg. 67 (2020-10-01), Heft 10, S. 8767-8777
Online
academicJournal
Zugriff:
Titel: |
A Prognostic Model Based on DBN and Diffusion Process for Degrading Bearing
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Autor/in / Beteiligte Person: | Hu, C. ; Pei, H. ; Si, X. ; Du, D. ; Pang, Z. ; Wang, X. |
Link: | |
Zeitschrift: | IEEE Transactions on Industrial Electronics, Jg. 67 (2020-10-01), Heft 10, S. 8767-8777 |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 0278-0046 (print) ; 1557-9948 (print) |
DOI: | 10.1109/TIE.2019.2947839 |
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