Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1599-1605
Online
academicJournal
Zugriff:
Titel: |
Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF
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Autor/in / Beteiligte Person: | Kuroda, J. ; Manabe, S. ; Watanabe, Y. ; Ito, K. ; Liao, W. ; Hashimoto, M. ; Abe, S. ; Harada, M. ; Oikawa, K. ; Miyake, Y. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1599-1605 |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2020.2978257 |
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