Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology
In: IEEE Access, Jg. 8 (2020), S. 126582-126590
Online
academicJournal
Zugriff:
Titel: |
Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology
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Autor/in / Beteiligte Person: | Zhang, N. ; Su, X. ; Guo, J. |
Link: | |
Zeitschrift: | IEEE Access, Jg. 8 (2020), S. 126582-126590 |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 2169-3536 (print) |
DOI: | 10.1109/ACCESS.2020.3008225 |
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