Increasing Accuracy of Software Defect Prediction using 1-dimensional CNN with SVM
In: IEEE International Conference for Innovation in Technology (INOCON); (2020-11-06) S. 1-6
Konferenz
Zugriff:
Titel: |
Increasing Accuracy of Software Defect Prediction using 1-dimensional CNN with SVM
|
---|---|
Autor/in / Beteiligte Person: | Yadav, Hitendra Singh |
Quelle: | IEEE International Conference for Innovation in Technology (INOCON); (2020-11-06) S. 1-6 |
Veröffentlichung: | 2020 |
Medientyp: | Konferenz |
ISBN: | 978-1-7281-9743-2 (print) ; 978-1-7281-9744-9 (print) |
DOI: | 10.1109/INOCON50539.2020.9298189 |
Sonstiges: |
|