Accurate Modeling of Cryogenic Temperature Effects in 10-nm Bulk CMOS FinFETs Using the BSIM-CMG Model
In: IEEE Electron Device Letters, Jg. 43 (2022-05-01), Heft 5, S. 689-692
Online
academicJournal
Zugriff:
Titel: |
Accurate Modeling of Cryogenic Temperature Effects in 10-nm Bulk CMOS FinFETs Using the BSIM-CMG Model
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Autor/in / Beteiligte Person: | Singh, S.K. ; Gupta, S. ; Vega, R.A. ; Dixit, A. |
Link: | |
Zeitschrift: | IEEE Electron Device Letters, Jg. 43 (2022-05-01), Heft 5, S. 689-692 |
Veröffentlichung: | 2022 |
Medientyp: | academicJournal |
ISSN: | 0741-3106 (print) ; 1558-0563 (print) |
DOI: | 10.1109/LED.2022.3158495 |
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