A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples
In: IEEE Transactions on Instrumentation and Measurement, Jg. 72 (2023), S. 1-10
Online
academicJournal
Zugriff:
Titel: |
A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples
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Autor/in / Beteiligte Person: | Zhao, H. ; Liu, J. ; Tang, J. ; Shen, X. ; Lu, S. ; Wang, Q. |
Link: | |
Zeitschrift: | IEEE Transactions on Instrumentation and Measurement, Jg. 72 (2023), S. 1-10 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 0018-9456 (print) ; 1557-9662 (print) |
DOI: | 10.1109/TIM.2022.3212041 |
Sonstiges: |
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