Nonlinear error analysis and calibration model for cyclic ADCs in large array CMOS image sensors
In: Microelectronics Reliability, Jg. 117 (2021-02-01)
academicJournal
Zugriff:
Titel: |
Nonlinear error analysis and calibration model for cyclic ADCs in large array CMOS image sensors
|
---|---|
Autor/in / Beteiligte Person: | Xu, Jiangtao ; Li, Tingting ; Nie, Kaiming ; Gao, Zhiyuan |
Link: | |
Zeitschrift: | Microelectronics Reliability, Jg. 117 (2021-02-01) |
Veröffentlichung: | 2021 |
Medientyp: | academicJournal |
ISSN: | 0026-2714 (electronic) |
DOI: | 10.1016/j.microrel.2021.114036 |
Sonstiges: |
|