Evidence of room temperature charging effects of silicon nanocrystals inside metal-oxide-semiconductor capacitors using feedback charge measurements
In: Microelectronic Engineering, Jg. 67 (2003), S. 858-864
academicJournal
Zugriff:
Titel: |
Evidence of room temperature charging effects of silicon nanocrystals inside metal-oxide-semiconductor capacitors using feedback charge measurements
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Autor/in / Beteiligte Person: | Ferraton, S. ; Montès, L. ; Souifi, A. ; Zimmermann, J. |
Link: | |
Zeitschrift: | Microelectronic Engineering, Jg. 67 (2003), S. 858-864 |
Veröffentlichung: | 2003 |
Medientyp: | academicJournal |
ISSN: | 0167-9317 (electronic) |
DOI: | 10.1016/S0167-9317(03)00193-X |
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