A new TCAD simulation method for direct CMOS electron detectors optimization
In: Ultramicroscopy, Jg. 243 (2023)
academicJournal
Zugriff:
Titel: |
A new TCAD simulation method for direct CMOS electron detectors optimization
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Autor/in / Beteiligte Person: | Marcelot, O. ; Marcelot, C. ; Corbière, F. ; Martin-Gonthier, P. ; Estribeau, M. ; Houdellier, F. ; Rolando, S. ; Pertel, C. ; Goiffon, V. |
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Zeitschrift: | Ultramicroscopy, Jg. 243 (2023) |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 0304-3991 (electronic) |
DOI: | 10.1016/j.ultramic.2022.113628 |
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