Current-related sensitivity optimization of CMOS five-contact vertical Hall sensor
In: Journal of Magnetism and Magnetic Materials, Jg. 497 (2020-03-01)
academicJournal
Zugriff:
Titel: |
Current-related sensitivity optimization of CMOS five-contact vertical Hall sensor
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Autor/in / Beteiligte Person: | Lyu, Fei ; Wang, Yu |
Link: | |
Zeitschrift: | Journal of Magnetism and Magnetic Materials, Jg. 497 (2020-03-01) |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 0304-8853 (electronic) |
DOI: | 10.1016/j.jmmm.2019.166069 |
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