Error Free CMOS Peak-Detect and Hold-Circuits 위한 오차 성분들의 분석 : Analysis of Error Sources for Error Free CMOS Peak-Detect and Hold-Circuits
In: 한국정보통신설비학회 학술대회, 2010-08-26, S. 287-289
academicJournal
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Error Free CMOS Peak-Detect and Hold-Circuits 위한 오차 성분들의 분석 : Analysis of Error Sources for Error Free CMOS Peak-Detect and Hold-Circuits
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Autor/in / Beteiligte Person: | 김세환 ; 정인일 ; 정태경 ; 최영완 ; Kim, Se-Hwan ; Jung, In-ll ; Jung, Tea-Kyung ; Choi, Young-Wan |
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Zeitschrift: | 한국정보통신설비학회 학술대회, 2010-08-26, S. 287-289 |
Veröffentlichung: | 2010 |
Medientyp: | academicJournal |
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