Characterization and design methodology for low-distortion MOSFET-C analog structures in multithreshold deep-submicrometer SIO CMOS technologies
In: IEEE Transactions on Electron Devices, Jg. 53 (2006-02-01), Heft 2, S. 263-269
Online
academicJournal
Zugriff:
Titel: |
Characterization and design methodology for low-distortion MOSFET-C analog structures in multithreshold deep-submicrometer SIO CMOS technologies
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Autor/in / Beteiligte Person: | Vancaillie, Laurent ; Kilchytska, Valeria ; Alvarado, Joaquin ; Cerdeira, Antonio ; Flandre, Denis |
Link: | |
Zeitschrift: | IEEE Transactions on Electron Devices, Jg. 53 (2006-02-01), Heft 2, S. 263-269 |
Veröffentlichung: | 2006 |
Medientyp: | academicJournal |
ISSN: | 0018-9383 (print) |
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