A neural network algorithm for testing stuck-open faults in CMOS combinational circuits
In: Journal of Electronic Testing, Jg. 4 (1993-08-01), Heft 3, S. 225
Online
academicJournal
Zugriff:
Titel: |
A neural network algorithm for testing stuck-open faults in CMOS combinational circuits
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Autor/in / Beteiligte Person: | Zhang, Zaifu ; Mcleod, Robert D. ; Pedrycz, Witold |
Link: | |
Zeitschrift: | Journal of Electronic Testing, Jg. 4 (1993-08-01), Heft 3, S. 225 |
Veröffentlichung: | 1993 |
Medientyp: | academicJournal |
ISSN: | 0923-8174 (print) |
Sonstiges: |
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