Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults
In: Journal of Electronic Testing, Jg. 6 (1995-02-01), Heft 1, S. 7
Online
academicJournal
Zugriff:
Titel: |
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults
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Autor/in / Beteiligte Person: | Metra, C. ; Favalli, M. ; Olivo, P. ; RiccA2, B. |
Link: | |
Zeitschrift: | Journal of Electronic Testing, Jg. 6 (1995-02-01), Heft 1, S. 7 |
Veröffentlichung: | 1995 |
Medientyp: | academicJournal |
ISSN: | 0923-8174 (print) |
Sonstiges: |
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