Channel-hot-carrier degradation and bias temperature instabilities in CMOS inverters
In: IEEE Transactions on Electron Devices, Jg. 56 (2009-09-01), Heft 9, S. 2155-2159
Online
academicJournal
Zugriff:
Titel: |
Channel-hot-carrier degradation and bias temperature instabilities in CMOS inverters
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Autor/in / Beteiligte Person: | Martin-Martinez, J. ; Gerardin, S. ; Amat, E. ; Rodriguez, R. ; Nafria, M. ; Aymerich, X. ; Paccagnella, A. ; Ghidini, G. |
Link: | |
Zeitschrift: | IEEE Transactions on Electron Devices, Jg. 56 (2009-09-01), Heft 9, S. 2155-2159 |
Veröffentlichung: | 2009 |
Medientyp: | academicJournal |
ISSN: | 0018-9383 (print) |
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