A built-in self-test of a CMOS ALU
In: IEEE Design & Test of Computers, Jg. v5 (1988-08-01), Heft n4, S. 38-48
Online
academicJournal
Zugriff:
Titel: |
A built-in self-test of a CMOS ALU
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Autor/in / Beteiligte Person: | Cerny, E. ; Aboulhamid, M. ; Bois, G. ; Cloutier, J. |
Link: | |
Zeitschrift: | IEEE Design & Test of Computers, Jg. v5 (1988-08-01), Heft n4, S. 38-48 |
Veröffentlichung: | 1988 |
Medientyp: | academicJournal |
ISSN: | 0740-7475 (print) |
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