Comparison of a 65 nm CMOS ring- and LC-oscillator based PLL in terms of TID and SEU sensitivity
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 245-252
Online
academicJournal
Zugriff:
Titel: |
Comparison of a 65 nm CMOS ring- and LC-oscillator based PLL in terms of TID and SEU sensitivity
|
---|---|
Autor/in / Beteiligte Person: | Leroux, Paul ; Steyaert, Michiel ; Moreira, Paulo ; Christiansen, Jorgen ; Prinzie, Jeffrey |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 245-252 |
Veröffentlichung: | 2017 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
Schlagwort: |
|
Sonstiges: |
|