Design and Sensitivity Improvement of CMOS-MEMS Scanning Microwave Microscopes
In: IEEE Transactions on Microwave Theory and Techniques, Jg. 65 (2017-08-01), Heft 8, S. 2749-2761
Online
academicJournal
Zugriff:
Titel: |
Design and Sensitivity Improvement of CMOS-MEMS Scanning Microwave Microscopes
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Autor/in / Beteiligte Person: | Azizi , Mostafa ; Mansour, Raafat R. |
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Zeitschrift: | IEEE Transactions on Microwave Theory and Techniques, Jg. 65 (2017-08-01), Heft 8, S. 2749-2761 |
Veröffentlichung: | 2017 |
Medientyp: | academicJournal |
ISSN: | 0018-9480 (print) |
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