On-Chip Silicon Odometers for Circuit Aging Characterization
In: Bias Temperature Instability for Devices and Circuits. 2014, p679-717.
Buch
Zugriff:
On-Chip Silicon Odometers for Circuit Aging Characterization The parametric shifts or circuit failures caused by Bias Temperature Instability (BTI) and other aging mechanisms in CMOS transistors have become more severe [...]
Titel: |
On-Chip Silicon Odometers for Circuit Aging Characterization
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Autor/in / Beteiligte Person: | Keane, John ; Wang, Xiaofei ; Jain, Pulkit ; Kim, Chris H |
Quelle: | Bias Temperature Instability for Devices and Circuits. 2014, p679-717. |
Veröffentlichung: | 2014 |
Medientyp: | Buch |
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