Characterization and modeling of MOS transistors from advanced technologies (FDSOI, nanowire, GaN HEMT, LTPS) / 최신 기술 적용 MOS 트랜지스터의 전기적 특성화 및 모델링 (FDSOI, nanowire, GaN HEMT, LTPS)
2024
Hochschulschrift
Zugriff:
Titel: |
Characterization and modeling of MOS transistors from advanced technologies (FDSOI, nanowire, GaN HEMT, LTPS) / 최신 기술 적용 MOS 트랜지스터의 전기적 특성화 및 모델링 (FDSOI, nanowire, GaN HEMT, LTPS)
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Autor/in / Beteiligte Person: | Donghyun KIM / 김동현 |
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Veröffentlichung: | 2024 |
Medientyp: | Hochschulschrift |
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