Extensive thermal-range simulation study of interface traps and oxide charges in an oxide-optimized MOS-capacitive radiation sensor for space applications
2024
Online
academicJournal
Zugriff:
Titel: |
Extensive thermal-range simulation study of interface traps and oxide charges in an oxide-optimized MOS-capacitive radiation sensor for space applications
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Autor/in / Beteiligte Person: | Shubham, Anjankar ; Rasika, Dhavse |
Link: | |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0374-4884 (print) |
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