Characterization and Modeling of Self-Heating in Nanometer Bulk-CMOS at Cryogenic Temperatures
In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021)
serialPeriodical
Zugriff:
Titel: |
Characterization and Modeling of Self-Heating in Nanometer Bulk-CMOS at Cryogenic Temperatures
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Autor/in / Beteiligte Person: | 't Hart, P.A. ; Babaie, M. ; Vladimirescu, A. ; Sebastiano, F. |
Link: | |
Zeitschrift: | IEEE Journal of the Electron Devices Society, Jg. 9 (2021) |
Veröffentlichung: | 2021 |
Medientyp: | serialPeriodical |
DOI: | 10.1109/jeds.2021.3116975 |
Sonstiges: |
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