Postirradiation Effects In Integrated Circuits
In: NASA Tech Briefs, Jg. 17 (1993-08-01), Heft 8
Online
report
Two reports discuss postirradiation effects in integrated circuits. Presents examples of postirradiation measurements of performances of integrated circuits of five different types: dual complementary metal oxide/semiconductor (CMOS) flip-flop; CMOS analog multiplier; two CMOS multiplying digital-to-analog converters; electrically erasable programmable read-only memory; and semiconductor/oxide/semiconductor octal buffer driver.
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Postirradiation Effects In Integrated Circuits
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Autor/in / Beteiligte Person: | Shaw, David C ; Barnes, Charles E |
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Zeitschrift: | NASA Tech Briefs, Jg. 17 (1993-08-01), Heft 8 |
Veröffentlichung: | United States: NASA Center for Aerospace Information (CASI), 1993 |
Medientyp: | report |
ISSN: | 0145-319X (print) |
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