Novel Techniques on Microwave Imaging and Circuit Calibration Using Vector Network Analyzer
2004
Hochschulschrift
Zugriff:
92
In this dissertation, novel techniques are developed for microwave imaging and circuit calibration using vector network analyzer (VNA). For microwave imaging applications, based on two-port VNA, three measurement systems are designed for quasi-monostaitc, bistatic and multistatic frequency-swept microwave imaging. Firstly, in Chapter 2, a quasi-monostatic frequency-swept microwave imaging system using multi-source illumination is proposed to have an efficient scattered field acquisition arrangement. Furthermore, the measurement system, calibration method and experimental results are presented. In order to implement the two-source and two-receiver multistatc arrangement, in Chapter 3, a new four-port test set is developed to connect with VNA for multistatic microwave imaging. In Chapter 4, the principle, measurement system, calibration and experimental results of bistatic microwave imaging in a multi-source illumination arrangement are presented. The experimental results shown in Chapter 2, 3 and 4 demonstrate that the three cost-effective imaging systems developed in this dissertation can improve the image resolution, object aspect angle and the efficiency of Fourier-domain data acquisition in comparison with the microwave imaging system using monostatic or bistatic arrangement with single-source illumination. For microwave circuit calibration applications, four novel calibration techniques are proposed in Chapter 5 to solve the difficulties in microwave circuit measurements using VNA. Firstly, a new test set with two-port stimulus is developed to avoid the switch leakage errors. Instead of TRL (thru, reflection, line) self-calibration procedure with limited frequency range, this test set exploits the wideband on-wafer TAN (thru, attenuation, network) calibration procedure to correct the measurement systematic errors. Secondly, the differential TRL calibration procedure is developed to improve the differential-type discontinuity measurement. Thirdly, in order to evaluate the performance of a single flip-chip interconnect, the TRL and LRL (short line, reflection, long line) calibration procedures are combined as a two-step de-embedding procedure to measure the characteristics of flip-chip interconnects. Finally, a novel three-port calibration method using three three-port calibrators is developed to calibrate a three-port VNA. It has the potential as an effective method to calibrate a multi-port VNA using multi-port calibrators.
Titel: |
Novel Techniques on Microwave Imaging and Circuit Calibration Using Vector Network Analyzer
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Autor/in / Beteiligte Person: | Tseng, Chao-Hsiung ; 曾昭雄 |
Link: | |
Veröffentlichung: | 2004 |
Medientyp: | Hochschulschrift |
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