Characterization of Hydrogenated Graphite Powder by X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry
2016
Online
Elektronische Ressource
Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C. The sp3 carbons formed at the edges of the surface of the hydrogenated graphite powder exhibited an sp3 carbon peak in the XPS C1s spectrum. The sp3-to-sp2 carbon ratio calculated from the XPS spectra increased from 0.08 to 1.19 after hydrogenation. Two sets of peaks, the Cx - and CxH- ion series (where x = 1, 2, 3...), were identified in the ToF-SIMS spectra of both the graphite powder and hydrogenated graphite powder. The difference between these two spectra represented an increase in the normalized intensities of the H- and CxH- ions in the spectrum of the hydrogenated graphite powder, indicating the formation of more sp3 carbons on the surface. © 2016 The Royal Society of Chemistry.
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Characterization of Hydrogenated Graphite Powder by X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry
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Veröffentlichung: | 2016 |
Medientyp: | Elektronische Ressource |
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