Characterization of charged defects in Cd_xHg_(1-x)Te and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy
2023
Online
Elektronische Ressource
© 1998 American Institute of Physics. This work was supported by DGICYT (Project PB93-1256) and by CICYT (Project IN93-0012). The help of Professor A. M. Baro´, Dr. A. Asenjo, and Dr. J. Gómez-Herrero is greatfully acknowledged. G. Panin thanks Spanish MEC for a research grant.
A correlative study of the electrically active defects of CdxHg1-xTe and CdTe crystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined system. Charged structural and compositional defects were revealed by the remote electron beam induced current (REBIC) mode of the scanning electron microscope. The electronic inhomogeneities of the samples were analyzed with nm resolution by current imaging tunneling spectroscopy (CITS) measurements, which showed the existence of built-in electrostatic barriers as well as local variations of the surface band gap in the defect areas imaged by REBIC.
DGICYT
CICYT
MEC
Depto. de Física de Materiales
Fac. de Ciencias Físicas
TRUE
pub
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Characterization of charged defects in Cd_xHg_(1-x)Te and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy
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Veröffentlichung: | 2023 |
Medientyp: | Elektronische Ressource |
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