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- Nachgewiesen in: USPTO Patent Applications
- Sprachen: English
- Document Number: 20110157592
- Publication Date: June 30, 2011
- Appl. No: 12/980094
- Application Filed: December 28, 2010
- Assignees: Industrial Technology Research Institute (Hsinchu, TW)
- Claim: 1. A surface plasmon resonance (SPR) unit, comprising: a microchannel unit, having at least one microchannel; and at least one grating structure, each configured with a metal layer and each being respectively disposed inside the at least one microchannel.
- Claim: 2. The SPR unit of claim 1, wherein the microchannel unit further comprises: a microchannel layer, configured with a first surface, a second surface, and at least one groove.
- Claim: 3. The SPR unit of claim 2, further comprising: a cover layer, disposed on the first surface.
- Claim: 4. The SPR unit of claim 2, wherein there are adhesive layers formed respectively on the first surface and the second surface.
- Claim: 5. The SPR unit of claim 3, further comprising: a substrate, disposed on the second surface while enabling the at least one grating structure to be formed on the substrate at a position corresponding to the at least one groove; and by the forming of the cover layer and the substrate on the microchannel layer, the at least one groove is shaped into the at least one microchannel.
- Claim: 6. The SPR unit of claim 2, wherein each groove is further comprised of: at least one manifold; and at least one inspection region connected to the at least one manifold.
- Claim: 7. The SPR unit of claim 3, wherein each groove is further connected to at least one storage well and at least one waste fluid well.
- Claim: 8. The SPR unit of claim 7, wherein there are expansion slots formed on the cover layer at positions respectively corresponding to the at least one storage well and the at least one waste fluid well while enabling the expansion slot that is arranged at the position corresponding to the at least one storage well to be connected to a loading well.
- Claim: 9. The SPR unit of claim 3, wherein there is a vent hole formed on the cover layer at a position corresponding to the at least one groove.
- Claim: 10. The SPR unit of claim 1, wherein the microchannel unit further comprises: a substrate, having at least one groove formed thereon.
- Claim: 11. The SPR unit of claim 10, further comprising: a cover layer, disposed on the substrate in a manner that the at least one groove is shaped into the at least one microchannel by the covering of the cover layer on the substrate.
- Claim: 12. The SPR unit of claim 11, wherein the at least one grating structure is formed on a position selected from the group consisting of: the bottom of the at least one groove and the cover layer.
- Claim: 13. The SPR unit of claim 11, wherein each groove is further comprised of: at least one manifold; and an inspection region connected to the at least one manifold.
- Claim: 14. The SPR unit of claim 11, wherein each groove is further connected to at least one storage well and at least one waste fluid well.
- Claim: 15. The SPR unit of claim 11, wherein there are expansion slots formed on the cover layer at positions respectively corresponding to the at least one storage well and the at least one waste fluid well while enabling the expansion slot arranged at the position corresponding to the at least one storage well to be connected to a loading well.
- Claim: 16. The SPR unit of claim 11, wherein there is a vent hole formed on the cover layer at a position corresponding to the at least one groove.
- Claim: 17. The SPR unit of claim 1, wherein the metal layer is a metal nano-thin film.
- Claim: 18. The SPR unit of claim 1, wherein there is a fluid flowing inside the at least one microchannel.
- Claim: 19. A surface plasmon resonance (SPR) inspection system, comprising: at least one SPR unit, each further comprising: a microchannel unit, having at least one microchannel; and at least one grating structure, each configured with a metal layer and each being respectively disposed inside the at least one microchannel; a light source module, for projecting an incident beam onto the at least one SPR unit for generating a detection beam accordingly; an optical detection module, for receiving the detection beam; and a rotation unit, for carrying the at least one SPR unit and capable of performing a rotation movement for bringing along the at least one SPR unit to rotate accordingly.
- Claim: 20. The SPR inspection system of claim 19, wherein the microchannel unit further comprises: a microchannel layer, configured with a first surface, a second surface, and at least one groove.
- Claim: 21. The SPR inspection system of claim 20, further comprising: a cover layer, disposed on the first surface.
- Claim: 22. The SPR inspection system of claim 21, further comprising: a substrate, disposed on the second surface while enabling the at least one grating structure to be formed on the substrate at a position corresponding to the at least one groove; and by the forming of the cover layer and the substrate on the microchannel layer, the at least one groove is shaped into the at least one microchannel.
- Claim: 23. The SPR inspection system of claim 20, wherein there are adhesive layers formed respectively on the first surface and the second surface
- Claim: 24. The SPR inspection system of claim 20, wherein each groove is further comprised of: at least one manifold; and an inspection region connected to the at least one manifold.
- Claim: 25. The SPR inspection system of claim 21, wherein each groove is further connected to at least one storage well and at least one waste fluid well.
- Claim: 26. The SPR inspection system of claim 25, wherein there are expansion slots formed on the cover layer at positions respectively corresponding to the at least one storage well and the at least one waste fluid well while enabling the expansion slot arranged at the position corresponding to the at least one storage well to be connected to a loading well.
- Claim: 27. The SPR inspection system of claim 21, wherein there is a vent hole formed on the cover layer at a position corresponding to the at least one groove.
- Claim: 28. The SPR inspection system of claim 19, wherein the microchannel unit further comprises a substrate, having at least one groove formed thereon while enabling the bottom of each groove to be formed with the grating structure.
- Claim: 29. The SPR inspection system of claim 28, further comprising: a cover layer, disposed on the substrate in a manner that the at least one groove is shaped into the at least one microchannel by the covering of the cover layer on the substrate.
- Claim: 30. The SPR inspection system of claim 29, wherein the at least one grating structure is formed on a position selected from the group consisting of: the bottom of the at least one groove and the cover layer.
- Claim: 31. The SPR inspection system of claim 28, wherein each groove is further comprised of: at least one manifold; and an inspection region connected to the at least one manifold.
- Claim: 32. The SPR inspection system of claim 28, wherein each groove is further connected to at least one storage well and at least one waste fluid well.
- Claim: 33. The SPR inspection system of claim 32, wherein there are expansion slots formed on the cover layer at positions respectively corresponding to the at least one storage well and the at least one waste fluid well while enabling the expansion slot arranged at the position corresponding to the at least one storage well to be connected to a loading well.
- Claim: 34. The SPR inspection system of claim 29, wherein there is a vent hole formed on the cover layer at a position corresponding to the at least one groove.
- Claim: 35. The SPR inspection system of claim 19, wherein the metal layer is a metal nano-thin film.
- Claim: 36. The SPR inspection system of claim 19, further comprising: a first linear displacement unit, for carrying the rotation unit while capable of performing an at least one-dimensional linear movement for adjusting the position of the rotation unit.
- Claim: 37. The SPR inspection system of claim 19, further comprising an angle adjustment device, coupled with the light source module and the optical detection module so as to adjust an included angle sandwiched between the two modules.
- Claim: 38. The SPR inspection system of claim 37, further comprising: a second linear displacement unit, coupled to the angle adjustment device while capable of performing an at least one-dimensional linear movement for adjusting the position of the angle adjustment device.
- Claim: 39. The SPR inspection system of claim 37, further comprising: a third linear displacement unit, for carrying the angle adjustment device while capable of performing an at least one-dimensional linear movement for adjusting the position of the angle adjustment device.
- Current U.S. Class: 356/445
- Current International Class: 01; 01
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