Einzeltreffer — DigiBib

A self-compensating fault locator (10) broadly comprises a testing unit (16) to take measurements across two test points (18), a processing unit (20) to locate faults by analyzing the measurements, and a switching unit (22) that can connect termination points (14) of an electrical circuit (12) to the test points (18) in a sequence controlled by the processing unit (20). The fault locator (10) may also include a harness (24) to connect the electrical circuit (12) to the switching unit (22). The processing unit (20) is preferably programed with the electrical circuit's (12) interconnection information. The processing unit (20) also preferably stores internal characteristics of the fault locator (10). Using the interconnection information and the internal characteristics, the processing unit (20) may accurately locate faults within the electrical circuit (12). Additionally, the processing unit (20) may locate faults within the fault locator (10) and/or the harness (24).

Titel:	Fault locator
Autor/in / Beteiligte Person:	Taylor, Ralph ; King, Harold ; Bequette, Michael
Link:	View record in USPTO Patent Grants (Volltext)
Veröffentlichung:	2005
Medientyp:	Patent
Sonstiges:	Nachgewiesen in: USPTO Patent Grants Sprachen: English Patent Number: 6,861,845 Publication Date: March 01, 2005 Appl. No: 10/308660 Application Filed: December 02, 2002 Assignees: DIT-MCO International Corporation (Kansas City, MO, US) Claim: 1. A fault locator operable to find faults within an electrical circuit having a plurality of termination points, the fault locator comprising: a testing unit having two test points and operable to take a resistance measurement and a capacitance measurement between the test points; a processing unit operable to locate a short-circuit fault and an open-circuit fault by performing calculations on the measurements taken by the testing unit, store internal characteristics which relate to the fault locator rather than the circuit being tested, and subtract the internal characteristics from the measurements in order to accurately locate the faults; and a switching unit operable to automatically reconfigure itself in order to connect the termination points to the test points in a sequence controlled by the processing unit. Claim: 2. The fault locator as set forth in claim 1 , wherein the processing unit is further operable to substantially determine how far the faults are located from at least one of the termination points. Claim: 3. The fault locator as set forth in claim 1 , wherein the processing unit is further operable to calculate a ratio relating to a conductor length between the faults and two of the termination points. Claim: 4. The fault locator as set forth in claim 1 , wherein the internal characteristics include an internal resistance and an internal capacitance. Claim: 5. The fault locator as set forth in claim 4 , wherein the processing unit is further operable to subtract the internal resistance from the resistance measurement in order to accurately locate the short-circuit fault. Claim: 6. The fault locator as set forth in claim 4 , wherein the processing unit is further operable to subtract the internal capacitance from the capacitance measurement in order to accurately locate the open-circuit fault. Claim: 7. The fault locator as set forth in claim 1 , further including a harness operable to mate the switching unit with the electrical circuit. Claim: 8. The fault locator as set forth in claim 7 , wherein the processing unit is further operable to locate a harness fault using the internal characteristics. Claim: 9. The fault locator as set forth in claim 1 , wherein the processing unit is further operable to locate a locator fault using the internal characteristics. Claim: 10. The fault locator as set forth in claim 1 , wherein the processing unit locates the short-circuit fault by performing calculations on the resistance measurement. Claim: 11. The fault locator as set forth in claim 1 , wherein the processing unit locates the open-circuit fault by performing calculations on the capacitance measurement. Claim: 12. A fault locator operable to find faults within an electrical circuit having a plurality of termination points, the fault locator comprising: a testing unit having two test points and operable to take a resistance measurement and a capacitance measurement between the test points; a processing unit operable to compensate for internal characteristics which relate at least to the fault locator while locating a short-circuit fault by performing calculations on the resistance measurement and an open-circuit fault by performing calculations on the capacitance measurement; and a switching unit operable to automatically reconfigure itself in order to connect the termination points to the test points in a sequence controlled by the processing unit. Claim: 13. The fault locator as set forth in claim 12 , wherein the processing unit is further operable to calculate a ratio relating to a conductor length between the faults and two of the termination points. Claim: 14. The fault locator as set forth in claim 12 , wherein the processing unit is further operable to store the internal characteristics including an internal resistance and an internal capacitance. Claim: 15. The fault locator as set forth in claim 14 , wherein the processing unit is further operable to subtract the internal resistance from the resistance measurement in order to accurately locate the short-circuit fault. Claim: 16. The fault locator as set forth in claim 14 , wherein the processing unit is further operable to subtract the internal capacitance from the capacitance measurement in order to accurately locate the open-circuit fault. Claim: 17. The fault locator as set forth in claim 12 , wherein the processing unit is further operable to locate a locator fault using the internal characteristics. Claim: 18. A self-compensating fault locator operable to find faults within an electrical circuit having a plurality of termination points, the fault locator comprising: a testing unit having two test points and operable to take both a resistance measurement and a capacitance measurement between the two test points: a processing unit operable to locate a short-circuit fault by calculating a resistance ratio relating to a conductor length between the short-circuit fault and at least one termination point, the resistance ratio being based on the resistance measurement and an internal resistance which relates to the fault locator; wherein the processing unit is further operable to locate an open-circuit fault by calculating a capacitance ratio relating to a conductor length between the open-circuit fault and at least one termination point, the capacitance ratio being based on the capacitance measurement and an internal capacitance which relates to the fault locator; and a switching unit operable to automatically reconfigure itself in order to connect the termination points to the test points in a sequence controlled by the processing unit. Claim: 19. The fault locator as set forth in claim 18 , further including a harness operable to mate the switching unit with the electrical circuit. Claim: 20. The fault locator as set forth in claim 19 , wherein the processing unit is further operable to locate a harness fault using the internal resistance and the internal capacitance. Claim: 21. The fault locator as set forth in claim 20 , wherein the processing unit is further operable to locate a locator fault using the internal resistance and the internal capacitance. Claim: 22. A fault locator operable to find faults within an electrical circuit having a plurality of termination points, the fault locator comprising: a testing unit having two test points and operable to take a resistance measurement and a capacitance measurement between the test points; a processing unit operable to locate a short-circuit fault and an open-circuit fault by performing calculations on the measurements taken by the testing unit, wherein the processing unit is further operable to store internal characteristics; a switching unit operable to automatically reconfigure itself in order to connect the termination points to the test points in a sequence controlled by the processing unit; a harness operable to mate the switching unit with the electrical circuit; and wherein the processing unit is further operable to locate a harness fault using the internal characteristics. Claim: 23. A self-compensating fault locator operable to find faults within an electrical circuit having a plurality of termination points, the fault locator comprising: a testing unit having two test points and operable to take a resistance measurement and a capacitance measurement between the test points; a processing unit operable to locate a short-circuit fault by calculating a resistance ratio relating to a conductor length between the short-circuit fault and at least one termination point, the resistance ratio being based on the resistance measurement and an internal resistance; wherein the processing unit is further operable to locate an open-circuit fault by calculating a capacitance ratio relating to a conductor length between the open-circuit fault and at least one termination point, the capacitance ratio being based on the capacitance measurement and an internal capacitance; a switching unit operable to automatically reconfigure itself in order to connect the termination points to the test points in a sequence controlled by the processing unit a harness operable to mate the switching unit with the electrical circuit; and wherein the processing unit is further operable to locate a harness fault using the internal resistance and the internal capacitance. Claim: 24. A fault locator operable to find faults within an electrical circuit having a plurality of circuit termination points, the fault locator comprising: a testing unit having two test points and operable to take a resistance measurement and a capacitance measurement between the test points; a processing unit operable to locate a short-circuit fault and an open-circuit fault by performing calculations on the measurements taken by the testing unit, wherein the processing unit is further operable to store internal characteristics which relate to the fault locator rather than the circuit being tested and subtract the internal characteristics from the measurements in order to accurately locate the faults; and a switching unit having a plurality of locator termination points at least equal in number to the circuit termination points, the switching unit being operable to automatically reconfigure itself in order to connect the locator termination points to the test points in a sequence controlled by the processing unit. Claim: 25. The fault locator as set forth in claim 24 , wherein the testing unit has only two test points and is operable to take both the resistance measurement and the capacitance measurement between the two test points. Current U.S. Class: 324/512 Patent References Cited: 4565966 January 1986 Burr et al. ; 5006808 April 1991 Watts ; 5621327 April 1997 Chiang et al. ; 5744964 April 1998 Sudo et al. ; 6456089 September 2002 Vuksic Primary Examiner: Deb, Anjan K. Attorney, Agent or Firm: Hovey Williams LLP

Klicken Sie ein Format an und speichern Sie dann die Daten oder geben Sie eine Empfänger-Adresse ein und lassen Sie sich per Email zusenden.

BibTeX Citavi, JabRef, u.a.
(Literaturverwaltung)

PDF kein Volltext!
(Merkzettel, Notizen)

RIS Endnote, Citavi u.a.
(Literaturverwaltung)

MODS
(XML zur Weiterverarbeitung)

oder

Wählen Sie das für Sie passende Zitationsformat und kopieren Sie es dann in die Zwischenablage, lassen es sich per Mail zusenden oder speichern es als PDF-Datei.

Gewünschter Zitations-Stil:

oder

Bitte prüfen Sie, ob die Zitation formal korrekt ist, bevor Sie sie in einer Arbeit verwenden. Benutzen Sie gegebenenfalls den "Exportieren"-Dialog, wenn Sie ein Literaturverwaltungsprogramm verwenden und die Zitat-Angaben selbst formatieren wollen.

Fault locator