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An interrupt signal EMG is put out to a microprocessor 10 when a thermal monitor 40 detects that a package temperature exceeds a reference. The microprocessor then increases a frequency division value N stored in a frequency division value register 31 of a clock mechanism 30. An inputted clock signal MCK is divided by N to generate a system clock signal SCK. Therefore, the frequency of system clock signal SCK decreases when N increases. Consequently, electricity consumption of each function module 20i decreases and the package temperature is reduced.

Titel:	Temperature controlled semiconductor circuit
Autor/in / Beteiligte Person:	Okada, Atsuhiko ; Wada, Hideaki ; Watanabe, Mitsuaki ; Iwai, Hajime ; Tabata, Hirosuke ; Kazuma, Shingo
Link:	View record in USPTO Patent Grants (Volltext)
Veröffentlichung:	2007
Medientyp:	Patent
Sonstiges:	Nachgewiesen in: USPTO Patent Grants Sprachen: English Patent Number: 7,165,183 Publication Date: January 16, 2007 Appl. No: 10/284132 Application Filed: October 31, 2002 Assignees: Oki Electric Industry Co., Ltd. (Tokyo, JP) Claim: 1. A semiconductor integrated circuit comprising: a substrate, a plurality of function modules on the substrate and performing different processes, a thermal detecting means to put out an interrupt signal when the temperature of the substrate exceeds a reference temperature, the thermal detecting means comprising a thermal detector that includes a ring oscillator on the substrate, a clock providing means, including a frequency division value register and an emergency frequency division value register, for providing each function module with an inputted clock signal divided by a frequency division value set in the frequency division value register, when the interrupt signal is not put out and divided by an emergency frequency division value set in the emergency frequency division value register when the interrupt signal is put out, and a microprocessor to control the system including the function modules as well as to provide the frequency division value according to the interrupt signal of the thermal interrupt means, wherein the thermal detector produces an output signal having a magnitude corresponding to the frequency of the ring oscillator, wherein the thermal detecting means further comprises a comparator to compare the output signal of the thermal detector to a reference signal, and an interrupt request register that receives an output signal from the comparator and outputs the interrupt signal to the microprocessor, and wherein the thermal detector additionally includes a counter that counts oscillations of the ring oscillator, a first data latch that holds a count value of the counter, a second data latch that holds the count value held by the first data latch, and a subtracter that subtracts the value held by the second data latch from the value held by the first data latch to generate the output signal of the thermal detector. Claim: 2. A semiconductor integrated circuit comprising: a substrate, a plurality of function modules on the substrate and performing different processes, a thermal detecting means to put out an interrupt signal when the substrate temperature exceeds a reference temperature, the thermal detecting means comprising a thermal detector that includes a ring oscillator on the substrate, an operation controlling means to provide the modules with operation controlling signals at regular intervals according to a table which designates an order in which the function modules are to be stopped when the interrupt signal is put out, and a clock controlling means to control output of a clock signal to the function modules according to the operation controlling signals, wherein the thermal detector produces an output signal having a magnitude corresponding to the frequency of the ring oscillator, wherein the thermal detecting means further comprises a comparator to compare the output signal of the thermal detector to a reference signal, and wherein the thermal detector additionally includes a counter that counts oscillations of the ring oscillator, a first data latch that holds a count value of the counter, a second data latch that holds the count value held by the first data latch, and a subtracter that subtracts the value held by the second data latch from the value held by the first data latch to generate the output signal of the thermal detector. Claim: 3. A semiconductor integrated circuit according to claim 2 wherein the table is compiled according to processes performed by the function modules. Claim: 4. A semiconductor integrated circuit according to claim 2 wherein the table is compiled according to electricity consumption of the function modules. Claim: 5. A semiconductor integrated circuit comprising: a substrate, a plurality of function modules on the substrate and performing different processes, a thermal detecting means for generating an interrupt signal when the substrate temperature exceeds a reference temperature, the thermal detecting means comprising a thermal detector that includes a ring oscillator on the substrate, and clock controlling means to put out an operation controlling signal for stopping function modules in a predetermined order during a first interval according to a table which is compiled from priorities assigned to the function modules when the interrupt signal is put out, and to put out another operation controlling signal for starting function modules in order during a second interval according to the table, output of a clock signal for the function modules being controlled according to the operation control signals, wherein the thermal detector produces an output signal having a magnitude corresponding to the frequency of the ring oscillator, wherein the thermal detecting means further comprises a comparator to compare the output signal of the thermal detector to a reference signal, and an interrupt request register that receives an output signal from the comparator and outputs the interrupt signal, and wherein the thermal detector additionally includes a counter that counts oscillations of the ring oscillator, a first data latch that holds a count value of the counter, a second data latch that holds the count value held by the first data latch, and a subtracter that subtracts the value held by the second data latch from the value held by the first data latch to generate the output signal of the thermal detector. Current U.S. Class: 713/322 Patent References Cited: 5483656 January 1996 Oprescu et al. ; 5713030 January 1998 Evoy ; 5736995 April 1998 Bohorquez et al. ; 6047248 April 2000 Georgiou et al. ; 6167330 December 2000 Linderman ; 6487668 November 2002 Thomas et al. ; 6718474 April 2004 Somers et al. ; 2002/0116563 August 2002 Lever ; 2002/0118045 August 2002 Horlander ; 2003/0215002 November 2003 Gorday et al. ; 2004/0182563 September 2004 Jeong ; 09-237132 September 1997 ; 10-124168 May 1998 ; 2000-222061 August 2000 Assistant Examiner: Rahman, Fahmida Primary Examiner: Trujillo, James K. Attorney, Agent or Firm: Rabin & Berdo, P.C.

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Temperature controlled semiconductor circuit