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System and method for measuring narrow and wide angle light scatter on a high-speed cell sorting device

Zordan, Michael D. ; Durack, Gary P. ; et al.
2015
Online Patent

Titel:
System and method for measuring narrow and wide angle light scatter on a high-speed cell sorting device
Autor/in / Beteiligte Person: Zordan, Michael D. ; Durack, Gary P. ; Yamada, Shinji ; Narahari, Bharath K. ; Eaton, Elizabeth C. ; Wallace, Jeffrey D. ; Arnold, Larry W. ; Keilbach, Kevin A.
Link:
Veröffentlichung: 2015
Medientyp: Patent
Sonstiges:
  • Nachgewiesen in: USPTO Patent Grants
  • Sprachen: English
  • Patent Number: 9,176,055
  • Publication Date: November 03, 2015
  • Appl. No: 13/623305
  • Application Filed: September 20, 2012
  • Assignees: Sony Corporation (Tokyo, JP), Sony Corporation of America (New York, NY, US)
  • Claim: 1. A system for measuring light scatter of a particle moving on a jetting axis, the system comprising: a forward angle light scatter light source for emission of electromagnetic radiation of a first wavelength directed on a forward source axis; a side scatter light source for emission of electromagnetic radiation of a second wavelength directed on a side source axis; wherein the first wavelength is different than the second wavelength; wherein the forward source axis is substantially orthogonal to the side source axis; wherein the jetting axis, the forward source axis and the side source axis intersect at a focus spot; wherein when the particle is in the focus spot it will produce forward angle light scatter having the first wavelength and side scatter light having the second wavelength; a collection optic having an optic axis; wherein the optic axis and the forward source axis are selected from the group consisting of: parallel and collinear, such that the collection optic receives both forward angle light scatter and side scatter light; a detector positioned in relation to the collection optic such that forward angle light scatter and side scatter light received by the collection optic impinge on the detector as combined forward angle light scatter and side scatter light, the detector producing a first output representative of a forward angle light scatter component of the combined forward angle light scatter and side scatter light, the detector producing a second output representative of a side scatter light component of the combined forward angle light scatter and side scatter light; and wherein the collection optic comprises a collection lens and a scatter angle selection filter assembly comprising: a first optical filter operative to substantially transmit the first wavelength and substantially block the second wavelength, the first optical filter having a first side, a second side, and a first optical filter axis; wherein the first optical filter axis is substantially collinear with the optic axis; a second optical filter operative to substantially transmit the second wavelength and substantially block the first wavelength, the second optical filter having a third side and a fourth side; wherein the third side of the second optical filter abuts the first side of the first optical filter; and a third optical filter operative to substantially transmit the second wavelength and substantially block the first wavelength, the third optical filter having a fifth side and a sixth side; wherein the fifth side of the second optical filter abuts the second side of the first optical filter.
  • Claim: 2. The system of claim 1 , wherein the forward angle light scatter light source comprises a first laser and the side scatter light source comprises a second laser.
  • Claim: 3. The system of claim 1 , wherein said electromagnetic radiation comprises visible light.
  • Claim: 4. A system for measuring light scatter of a particle moving on a jetting axis, the system comprising: a forward angle light scatter light source for emission of electromagnetic radiation of a first wavelength; a side scatter light source for emission of electromagnetic radiation of a second wavelength; wherein the first wavelength is different than the second wavelength; wherein the electromagnetic radiation of a first wavelength and the electromagnetic radiation of a second wavelength meet at a focus spot; wherein when the particle is in the focus spot it will produce forward angle light scatter having the first wavelength and side scatter light having the second wavelength; a collection optic operative to receive both forward angle light scatter and side scatter light; a detector positioned in relation to the collection optic such that forward angle light scatter and side scatter light received by the collection optic impinge on the detector as combined forward angle light scatter and side scatter light, the detector producing a first output representative of a forward angle light scatter component of the combined forward angle light scatter and side scatter light, the detector producing a second output representative of a side scatter light component of the combined forward angle light scatter and side scatter light; and wherein the collection optic comprises a collection lens and a scatter angle selection filter assembly comprising: a first optical filter operative to substantially transmit the first wavelength and substantially block the second wavelength, the first optical filter having a first side, a second side, and a first optical filter axis; wherein the first optical filter axis is substantially collinear with the optic axis; a second optical filter operative to substantially transmit the second wavelength and substantially block the first wavelength, the second optical filter having a third side and a fourth side; wherein the third side of the second optical filter abuts the first side of the first optical filter; and a third optical filter operative to substantially transmit the second wavelength and substantially block the first wavelength, the third optical filter having a fifth side and a sixth side; wherein the fifth side of the second optical filter abuts the second side of the first optical filter.
  • Claim: 5. The system of claim 4 , wherein: the electromagnetic energy of a first wavelength is directed on a forward source axis; the electromagnetic energy of a second wavelength is directed on a side source axis; the forward source axis is substantially orthogonal to the side source axis; the jetting axis, the forward source axis and the side source axis intersect at the focus spot; the collection optic has an optic axis; and the optic axis and the forward source axis are selected from the group consisting of: parallel and collinear.
  • Claim: 6. The system of claim 4 , wherein the forward angle light scatter light source comprises a first laser and the side scatter light source comprises a second laser.
  • Claim: 7. The system of claim 4 , wherein said electromagnetic radiation comprises visible light.
  • Claim: 8. A scatter angle selection filter for angular selection of light scatter from a particle moving on a jetting axis, comprising: a first optical filter operative to substantially transmit a first wavelength and substantially block a second wavelength, the first optical filter having a first side and a second side; wherein the first wavelength is different than the second wavelength; a second optical filter operative to substantially transmit the second wavelength and substantially block the first wavelength, the second optical filter having a third side and a fourth side; wherein the third side of the second optical filter abuts the first side of the first optical filter; and a third optical filter operative to substantially transmit the second wavelength and substantially block the first wavelength, the third optical filter having a fifth side and a sixth side; wherein the fifth side of the second optical filter abuts the second side of the first optical filter.
  • Claim: 9. The scatter angle selection filter of claim 8 , further comprising: a forward angle light scatter light source for emission of electromagnetic radiation of the first wavelength directed on a forward source axis; a side scatter light source for emission of electromagnetic radiation of the second wavelength directed on a side source axis; wherein the forward source axis is substantially orthogonal to the side source axis; wherein the jetting axis, the forward source axis and the side source axis intersect at a focus spot; wherein when the particle is in the focus spot it will produce forward angle light scatter having the first wavelength and side scatter light having the second wavelength; and a collection optic having an optic axis; wherein the first optical filter has a first optical filter axis; wherein the first optical filter axis is substantially collinear with the optic axis; and wherein the optic axis and the forward source axis are selected from the group consisting of: parallel and collinear, such that the collection optic receives both forward angle light scatter and side scatter light.
  • Patent References Cited: 4999513 March 1991 Ito et al. ; 5173808 December 1992 Auer et al. ; 5260764 November 1993 Fukuda et al. ; 5436717 July 1995 Ogino ; 5521699 May 1996 Kosaka et al. ; 5548395 August 1996 Kosaka ; 5824269 October 1998 Kosaka et al. ; 5895922 April 1999 Ho ; 6054712 April 2000 Komardin et al. ; 6403947 June 2002 Hoyt et al. ; 6967795 November 2005 Cheng et al. ; 6979570 December 2005 Narisada ; 7477363 January 2009 Nagai ; 7843561 November 2010 Rich ; 2008/0213915 September 2008 Durack et al. ; 2008/0304062 December 2008 Kanda ; 2011/0044695 February 2011 Jun et al. ; 0442025 June 1990 ; 0564122 October 1993 ; WO 2005/033654 April 2005
  • Other References: Luminex Life Science Assays, www.diax.it/applications/dettagli/Luminex Life Science Assays.html, Apr. 27, 2012, 3 pages. cited by applicant ; Patent Application No. 201380000169.0, Chinese Patent Office, Office Action, dated Jul. 31, 2014. cited by applicant ; Patent Application No. 201380000169.0, Chinese Patent Office, English Translation of Office Action, dated Jul. 31, 2014. cited by applicant
  • Primary Examiner: Pham, Hoa
  • Attorney, Agent or Firm: Ice Miller LLP

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