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- Nachgewiesen in: USPTO Patent Grants
- Sprachen: English
- Patent Number: 10718,838
- Publication Date: July 21, 2020
- Appl. No: 15/573945
- Application Filed: May 13, 2016
- Assignees: The Medical College of Wisconsin, lnc. (Milwaukee, WI, US)
- Claim: 1. A computer-implemented method for determining magnetic resonance imaging (“MRI”) scan parameters for a multi-spectral imaging (“MSI”) scan, the steps of the method comprising: (a) providing to a computer system, calibration data acquired with an MRI system from a field-of-view, wherein the calibration data contains data acquired at a plurality of different resonance frequency offsets; (b) computing with the computer system, a field map from the calibration data, the field map containing information about off-resonance effects in the field-of-view; (c) determining with the computer system, a spectral range from the computed field map; (d) setting with the computer system, a number of spectral bins based on the determined spectral range; (e) generating with the computer system, scan parameters based on the number of spectral bins and the determined spectral range, the scan parameters defining the spectral bins at which spins are to be excited and data are to be acquired with an MRI system performing an MSI scan; and (f) sending the scan parameters to the MRI system and performing the MSI scan in order to acquire data from a subject by operating the MRI system using the scan parameters, the data being acquired at the number of spectral bins set by the computer system.
- Claim: 2. The method as recited in claim 1 , wherein step (a) includes acquiring the calibration data with the MRI system.
- Claim: 3. The method as recited in claim 1 , wherein the calibration data provided in step (a) have a lower spatial resolution than the data to be acquired with the MRI system using the scan parameters generated in step (e).
- Claim: 4. The method as recited in claim 1 , wherein step (c) includes calculating with the computer system, a frequency cutoff value from a frequency map generated by the computer system from the provided calibration data.
- Claim: 5. The method as recited in claim 4 , wherein the computer system calculates the frequency cutoff value by: computing a histogram from the frequency map; calculating a forward cumulative distribution function (CDF) by integrating the histogram from low frequencies to high frequencies; calculating a backward CDF by integrating the histogram from high frequencies to low frequencies; determining a first frequency cutoff value using the forward CDF to identify a frequency value that retains a selected amount of signal intensities in the frequency map; determining a second frequency cutoff value using the backward CDF to identify a frequency value that retains the selected amount of signal intensities in the frequency map; and selecting the frequency cutoff value based on a value of the first frequency cutoff value and a value of the second frequency cutoff value.
- Claim: 6. The method as recited in claim 5 , wherein the frequency cutoff value is selected as a signed value of the one of the first frequency cutoff value and second frequency cutoff value having a greater absolute value.
- Claim: 7. The method as recited in claim 4 , wherein the computer system computes a magnitude mask from the calibration data and masks the frequency map with the magnitude mask before calculating the frequency cutoff value.
- Claim: 8. The method as recited in claim 7 , wherein the magnitude mask includes a high-intensity mask that masks high signal intensities and a low-intensity mask that masks low signal intensities.
- Claim: 9. The method as recited in claim 4 , wherein the computer system generates the frequency map from magnitude images reconstructed from the calibration data.
- Claim: 10. The method as recited in claim 4 , wherein step (d) includes setting the number of spectral bins as an integer closest to, wherein is the frequency cutoff value.
- Claim: 11. The method as recited in claim 1 , wherein step (c) includes calculating with the computer system, a frequency cutoff value based on a signal loss threshold that defines an acceptable level of signal loss in a volume around the metallic object.
- Claim: 12. The method as recited in claim 11 , wherein the computer system calculates the frequency cutoff by: computing a histogram from the field map; determining a symmetric number of voxels on either side of the histogram that sum to a volumetric tolerance defined by the signal loss threshold; and computing the frequency cutoff value based on the determined symmetric number of voxels.
- Claim: 13. The method as recited in claim 12 , wherein step (d) includes setting the number of spectral bins as an integer closest to, wherein is the frequency cutoff value.
- Claim: 14. The method as recited in claim 1 , wherein the off-resonance effects in the field-of-view are caused by a metallic object in the field-of-view, and wherein the metallic object is at least one of a metallic implant or a metallic device.
- Claim: 15. The method as recited in claim 1 , wherein the calibration data are three-dimensional calibration data.
- Claim: 16. The method as recited in claim 15 , wherein the MSI scan is a three-dimensional MSI scan.
- Claim: 17. The method as recited in claim 1 , wherein the calibration data are two-dimensional calibration data.
- Claim: 18. The method as recited in claim 17 , wherein the MSI scan is a two-dimensional MSI scan.
- Claim: 19. A method for producing an image of a subject using a magnetic resonance imaging (MRI) system, the steps of the method comprising: (a) acquiring calibration data from the subject using the MRI system, wherein the calibration data include data acquired at a plurality of different resonance frequency offsets; (b) determining with the computer system, a spectral range from the acquired calibration data; (c) setting with the computer system, a number of spectral bins based on the determined spectral range; (d) acquiring data from the subject using the MRI system, the data being acquired at the number of spectral bins set by the computer system; (e) reconstructing with the computer system, an image of the subject for each spectral bin from the acquired data; and (f) producing with the computer system, a desired image of the subject by combining the images reconstructed in step (e).
- Claim: 20. The method as recited in claim 19 , wherein the calibration data acquired in step (a) have a lower spatial resolution than the data acquired in step (d).
- Claim: 21. The method as recited in claim 20 , wherein step (b) includes calculating with the computer system, a frequency cutoff value from the acquired calibration data.
- Claim: 22. The method as recited in claim 21 , wherein the computer system calculates the frequency cutoff value by: producing a frequency map from the acquired calibration data; computing a histogram from the frequency map; calculating a forward cumulative distribution function (CDF) by integrating the histogram from low frequencies to high frequencies; calculating a backward CDF by integrating the histogram from high frequencies to low frequencies; determining a first frequency cutoff value using the forward CDF to identify a frequency value that retains a selected amount of signal intensities in the frequency map; determining a second frequency cutoff value using the backward CDF to identify a frequency value that retains the selected amount of signal intensities in the frequency map; and selecting the frequency cutoff value based on a value of the first and second frequency cutoff values.
- Claim: 23. The method as recited in claim 22 , wherein step (d) includes setting the number of spectral bins as an integer closest to, wherein is the frequency cutoff value.
- Claim: 24. The method as recited in claim 21 , wherein the computer system calculates the frequency cutoff by: selecting a signal loss threshold that defines an acceptable level of signal loss in a volume around the metallic object; producing a field map from the calibration data; computing a histogram from the field map; determining a symmetric number of voxels on either side of the histogram that sum to a volumetric tolerance defined by the signal loss threshold; and computing the frequency cutoff value based on the determined symmetric number of voxels.
- Claim: 25. The method as recited in claim 21 , wherein the computer system calculates the frequency cutoff by: defining a threshold for an amount of volumetric imaging signal in a useable spectral bin; finding a minimum and a maximum frequency offset spectral bin that each contain the amount of volumetric imaging signal; and computing the frequency cutoff value based on the frequency offsets of the minimum and maximum bins.
- Claim: 26. The method as recited in claim 19 , wherein the calibration data acquired from the subject are three-dimensional calibration data.
- Claim: 27. The method as recited in claim 26 , wherein the data acquired from the subject are three-dimensional data.
- Claim: 28. The method as recited in claim 19 , wherein the calibration data acquired from the subject are two-dimensional calibration data.
- Claim: 29. The method as recited in claim 28 , wherein the data acquired from the subject are two-dimensional data.
- Patent References Cited: 7928729 April 2011 Hargreaves et al. ; 8482279 July 2013 Chen et al. ; 8995738 March 2015 Hernando et al. ; 10061007 August 2018 Gui ; 2006/0091881 May 2006 Clarke ; 2007/0091428 April 2007 Wilson ; 2007/0241753 October 2007 Sodickson et al. ; 2011/0103670 May 2011 Koch ; 2011/0241669 October 2011 Chen ; 2011/0262017 October 2011 Haacke et al. ; 2012/0301004 November 2012 Kingston ; 2012/0314926 December 2012 Ghosh et al. ; 2013/0113486 May 2013 Imamura et al. ; 2013/0249554 September 2013 Simonetti et al. ; 2013/0265046 October 2013 Koch ; 2013/0281822 October 2013 Graziani ; 2014/0002080 January 2014 Den Harder ; 2014/0212012 July 2014 Fain ; 2014/0212015 July 2014 Ding et al. ; 2015/0293198 October 2015 Grodzki ; 2016/0306021 October 2016 Weber ; 2014/071249 May 2014
- Other References: International Search Report and Written Opinion for International Patent Application No. PCT/US2016/032383 dated Aug. 16, 2016. cited by applicant
- Primary Examiner: Hawkins, Dominic E
- Attorney, Agent or Firm: Quarles & Brady LLP
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