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- Nachgewiesen in: USPTO Patent Grants
- Sprachen: English
- Patent Number: 11949,453
- Publication Date: April 02, 2024
- Appl. No: 17/846604
- Application Filed: June 22, 2022
- Assignees: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, KR)
- Claim: 1. A test device for testing a distributed feedback laser diode (DFB-LD) device for an optical transceiver of a radio over fiber (RoF) system, comprising: a current source for inputting a current into the DFB-LD to generate an optical output and a PD current output during testing; a computer for applying maximum and minimum limiting ratings for a plurality of parameters to the DFB-LD device during testing, wherein the parameters are applied one at a time while all other parameters are kept in a normal performance range for a preset period of time and no fatal damage to the DFD-LD occurs during the preset period of time; a case for subjecting the DFB-LD to a desired temperature during testing; the computer for applying various functional specification parameters according to an operating condition for a function specification to the DFB-LD device during testing, and a measuring device for measuring the optical output and the PD current output during testing.
- Claim: 2. The test device of claim 1 , wherein the operating condition for the functional specification comprises an environmental temperature and a case temperature.
- Claim: 3. The test device of claim 1 , wherein the parameters for the functional specification comprise: (i) a threshold current, (ii) an optical output power at the threshold current, (iii) an operating current, (iv) an operating voltage, (v) a slope efficiency, (vi) a delta slope efficiency, (vii) a light-emission current wavelength, (viii) a wavelength temperature coefficient, (ix) a side mode suppression ratio, (x) a tracking error, (xi) a monitor current, (xii) a dark current, (xiii) a relative intensity noise, and (xiv) a third-order intermodulation distortion.
- Claim: 4. The test device of claim 1 , wherein a test plan for the DFB-LD device comprises: (i) a package, (ii) first temperature storage, (iii) second temperature storage, (iv) temperature cycling, (v) damp heat, (vi) temperature-humidity cycling, (vii) fiber pull, (viii) laser diode sub-mount, (ix) a photodiode in a representative package, (x) a mechanical impact, (ix) a vibration, (xii) a drastic temperature change, (xiii) an electrostatic discharge (ESD), and (xiv) an internal humidity, under which a test on the DFB-LD device is performed.
- Claim: 5. The test device of claim 1 , wherein a laser diode of the DFB-LD device is tested according to an operating current, a slope efficiency, a forward voltage, and a kink on a light-current (L/I) curve.
- Claim: 6. The test device of claim 1 , wherein a photodiode of the DFB-LD device is tested according to a dark current.
- Claim: 7. The test device of claim 1 , wherein a laser package of the DFB-LD device is tested according to (i) an operating current, (ii) an output power of a fiber or connector, (iii) a kink on an L/I curve, (iv) a tracking error, and (v) a photodiode dark current.
- Claim: 8. A test method of testing a distributed feedback laser diode (DFB-LD) device for an optical transceiver of a radio over fiber (RoF) system, the test method comprising: identifying the DFB-LD device; and inputting a current into the DFB-LD to generate an optical output and a PD current output during testing; applying maximum and minimum limiting ratings for a plurality of parameters to the DFB-LD device during testing, wherein the parameters are applied one at a time while all other parameters are kept in a normal performance range for a preset period of time and no fatal damage to the DFD-LD occurs during the preset period of time; subjecting the DFB-LD to a desired temperature during testing; applying various functional specification parameters according to an operating condition for a function specification to the DFB-LD device during testing, and measuring the optical output and the PD current output during testing.
- Claim: 9. The test method of claim 8 , wherein the operating condition for the functional specification comprises an environmental temperature and a case temperature.
- Claim: 10. The test method of claim 8 , wherein parameters for the functional specification comprise: (i) a threshold current, (ii) an optical output power at the threshold current, (iii) an operating current, (iv) an operating voltage, (v) a slope efficiency, (vi) a delta slope efficiency, (vii) a light-emission current wavelength, (viii) a wavelength temperature coefficient, (ix) a side mode suppression ratio, (x) a tracking error, (xi) a monitor current, (xii) a dark current, (xiii) a relative intensity noise, and (xiv) a third-order intermodulation distortion.
- Claim: 11. The test method of claim 8 , wherein a test plan for the DFB-LD device comprises: (i) a package, (ii) first temperature storage, (iii) second temperature storage, (iv) temperature cycling, (v) damp heat, (vi) temperature-humidity cycling, (vii) fiber full, (viii) a laser diode sub-mount, (ix) a photodiode in a representative package, (x) a mechanical impact, (xi) a vibration, (xii) a drastic temperature change, (xiii) an electrostatic discharge (ESD), and (xiv) an internal humidity, under which the test is performed.
- Claim: 12. The test method of claim 8 , wherein a laser diode of the DFB-LD device is tested according to an operating current, a slope efficiency, a forward voltage, and a kink on a light-current (L/I) curve.
- Claim: 13. The test method of claim 8 , wherein a photodiode of the DFB-LD device is tested according to a dark current.
- Claim: 14. The test method of claim 8 , wherein a laser package of the DFB-LD device is tested according to (i) an operating current, (ii) an output power of a fiber or connector, (iii) a kink on an L/I curve, (iv) a tracking error, and (v) a photodiode dark current.
- Patent References Cited: 6349103 February 2002 Chung ; 6629638 October 2003 Sanchez ; 7182510 February 2007 Cahill ; 7711265 May 2010 Inman ; 7954358 June 2011 Lerner ; 8583395 November 2013 Dybsetter ; 9065571 June 2015 Levinson ; 9184850 November 2015 Aronson ; 9455550 September 2016 Uetsuji et al. ; 9602897 March 2017 Coffey ; 10200125 February 2019 Cho et al. ; 20010026572 October 2001 Shimizu ; 20020101898 August 2002 Lo ; 20030219051 November 2003 Hsieh ; 20040019459 January 2004 Dietz ; 20040027575 February 2004 Von Drasek ; 20040131099 July 2004 Thiyagarajan ; 20080212637 September 2008 Makino ; 20140334512 November 2014 Kwon et al. ; 20150110144 April 2015 Kwon et al. ; 20160013621 January 2016 Leem et al. ; 20190036293 January 2019 Kobayashi ; 20200194971 June 2020 Shindo
- Other References: Rick Manderscheid, “1st Level Qualification for Optical Devices,” CISCO, (Apr. 15, 2010). cited by applicant ; George Zhong, “Preliminary Specification of 1.27um˜1.61um CWDM MQW-DFB Laser Diode Module: Analog CWDM of less than 2GHz application,” Eoptolink Technology Inc., Ltd, (Apr. 12, 2016). cited by applicant
- Primary Examiner: Lee, Jai M
- Attorney, Agent or Firm: LRK PATENT LAW FIRM
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