Resistance Characteristics of Thin Films and Contacts in CMOS under Cryogenic Temperature and High Magnetic Field Environment
In: JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Jg. 24 (2024-04-30), Heft 2, S. 122-126
Online
academicJournal
Zugriff:
Titel: |
Resistance Characteristics of Thin Films and Contacts in CMOS under Cryogenic Temperature and High Magnetic Field Environment
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Autor/in / Beteiligte Person: | Shim, Dongha ; Kim, Deokgi |
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Zeitschrift: | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Jg. 24 (2024-04-30), Heft 2, S. 122-126 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 1598-1657 (print) ; 2233-4866 (print) |
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