Characterization of Noise in CMOS Ring Oscillators at Cryogenic Temperatures
In: IEEE Electron Device Letters, vol PP, 2023, Heft 99
Online
academicJournal
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Characterization of Noise in CMOS Ring Oscillators at Cryogenic Temperatures
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Autor/in / Beteiligte Person: | Mukim, Prashansa ; Shrestha, Pragya R ; Madhavan, Advait ; Prasad, Nitin ; Campbell, Jason ; Brewer, Forrest D ; Stiles, Mark D ; McClelland, Jabez J |
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Zeitschrift: | IEEE Electron Device Letters, vol PP, 2023, Heft 99 |
Veröffentlichung: | eScholarship, University of California, 2023 |
Medientyp: | academicJournal |
Umfang: | 1 - 1 |
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