Estimating Low-Temperature RTS Rate in MCT FPA Through High-Temperature Noise Measurements
In: Journal of Electronic Materials, 2024-04-22, S. 1-7
Online
academicJournal
Zugriff:
Titel: |
Estimating Low-Temperature RTS Rate in MCT FPA Through High-Temperature Noise Measurements
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Autor/in / Beteiligte Person: | Claret, Antoine ; Cervera, Cyril ; Baier, Nicolas ; Gravrand, Olivier ; Kerlain, Alexandre ; Rubaldo, Laurent ; Goiffon, Vincent |
Link: | |
Zeitschrift: | Journal of Electronic Materials, 2024-04-22, S. 1-7 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0361-5235 (print) ; 1543-186X (print) |
DOI: | 10.1007/s11664-024-11067-z |
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