Investigating the Electrothermal Characteristics of Partially Depleted Submicron SOI CMOS Transistors in an Extended Temperature Range
In: Russian Microelectronics, Jg. 49 (2020), Heft 1, S. 30-36
Online
academicJournal
Zugriff:
Titel: |
Investigating the Electrothermal Characteristics of Partially Depleted Submicron SOI CMOS Transistors in an Extended Temperature Range
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Autor/in / Beteiligte Person: | Rumyantsev, S. V. ; Novoselov, A. S. ; Masal’skii, N. V. |
Link: | |
Zeitschrift: | Russian Microelectronics, Jg. 49 (2020), Heft 1, S. 30-36 |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 1063-7397 (print) ; 1608-3415 (print) |
DOI: | 10.1134/s1063739720010102 |
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