LAr TPC Electronics CMOS Lifetime at 300 K and 77 K and Reliability Under Thermal Cycling
2013
Online
academicJournal
Titel: |
LAr TPC Electronics CMOS Lifetime at 300 K and 77 K and Reliability Under Thermal Cycling
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Autor/in / Beteiligte Person: | Radeka, V. |
Link: | |
Veröffentlichung: | 2013 |
Medientyp: | academicJournal |
DOI: | 10.1109/TNS.2013.2287156 |
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