Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype
2016
Online
academicJournal
Titel: |
Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype
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Autor/in / Beteiligte Person: | Xu, L. [Brookhaven National Lab. (BNL), Upton, NY (United States)] |
Link: | |
Veröffentlichung: | 2016 |
Medientyp: | academicJournal |
ISSN: | 1748-0221 (print) |
DOI: | 10.1088/1748-0221/11/07/P07019 |
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