Pulse Quenching and Charge-Sharing Effects on Heavy-Ion Microbeam Induced ASET in a Full-Custom CMOS OpAmp.
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1473-1482
Online
academicJournal
Zugriff:
Titel: |
Pulse Quenching and Charge-Sharing Effects on Heavy-Ion Microbeam Induced ASET in a Full-Custom CMOS OpAmp.
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Autor/in / Beteiligte Person: | Fontana, Andres ; Pazos, Sebastian ; Aguirre, Fernando ; Vega, Nahuel ; Muller, Nahuel ; De La Fourniere, Emmanuel ; Silveira, Fernando ; Debray, Mario E. ; Palumbo, Felix |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1473-1482 |
Veröffentlichung: | 2019 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2019.2908174 |
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