Radiation Effects in Pinned Photodiode CMOS Image Sensors: Variation of Photodiode Implant Dose.
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1671-1681
Online
academicJournal
Zugriff:
Titel: |
Radiation Effects in Pinned Photodiode CMOS Image Sensors: Variation of Photodiode Implant Dose.
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Autor/in / Beteiligte Person: | Belloir, Jean-Marc ; Virmontois, Cedric ; Estribeau, Magali ; Goiffon, Vincent ; Magnan, Pierre ; Materne, Alex ; Bardoux, Alain |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1671-1681 |
Veröffentlichung: | 2019 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2019.2922659 |
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